Videos -> International Test Conference (ITC)
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2019 ITC Keynotes by DARPA and PDF Solutions
PDF Solutions
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Description: Keynote 2 -
“Incorporation of Security into Chip Design", Serge Leef, Program Manager, DARPA
”Visionary 2 - "The Outlook for More » |
Description: Keynote 2 -
“Incorporation of Security into Chip Design", Serge Leef, Program Manager, DARPA
”Visionary 2 - "The Outlook for Manufacturing Test in a Future Driven by Big Data Analytics and the IIoT”, John Kibarian, President & CEO, PDF Solutions « Less |
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