Loading the player ...
|
Peter van den Eijnden, Managing Director JTAG Technologies
|
1,547 views |
|
| «Prev Next» |
Keywords: Peter van den Eijnden, JTAG Technologies, EDA, IPC, APEX, fault coverage, diagnostics, board test, jtag functional test, system on chip test, test |
Description: Sanjay Gangal interviews Peter van den Eijnden, Managing Director of JTAG Technologies at 2016 IPC/APEX Expo. |
Views: 1357
|
Views: 1738
|
Views: 2065
|
Views: 1588
|
Views: 1800
|
Views: 1346
|
Views: 1504
|
Views: 1322
|
Views: 1525
|
Views: 1174
|
Views: 1546
|
Views: 2491
|
Views: 1316
|
Views: 1603
|
Views: 1489
|
Total : 15
|