| Description: A successful design is not just a design that meets its specifications. When manufactured, especially in big quantities, variation in its components or in the manufacturing process parameters can result in costly failures. This paper will present a unique design methodology that would turn any standard design into a robust first pass success design with high performance and RF yield. The methodology offers a way for designers to quickly and easily make their existing designs more robust and insensitive to process variation. It incorporates two powerful tools — Yield Sensitivity Histograms (YSH) and Design of Experiments (DOE)—both of which can be used to identify exact problem areas in a design, fix them, and thus produce designs that are immune to process variations. As a result, the designs will also become less sensitive to other external factors such as changes in temperature and supply voltage, and effects of packages and bond wires. Applying these techniques will improve designs performance and reliability, thus allowing manufacturing them with full confidence in meeting first pass success with high performance and yield. « Less |
