A low aperture jitter specification of an ADC is critical to achieving high levels of signal-to-noise ratios (SNR). (See References 1, 2, and 3). ADCs are available with aperture jitter specifications as low as 60-fs rms (AD9445 14-bits @ 125 MSPS and AD9446 16-bits @ 100 MSPS). Extremely low jitter sampling clocks must therefore be utilized so that the ADC performance is not degraded, because the total jitter is the root-sum-square of the internal converter aperture jitter and the external sampling clock jitter. However, oscillators used for sampling clock generation are more often specified in terms of phase noise rather than time jitter. The purpose of this discussion is to develop a simple method for converting oscillator phase noise into time jitter.
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