"For leadership in practical design-for-test of integrated circuits"
About Dr. Wang
Dr. Wang founded SynTest in January 1990. Since then, Dr. Wang has led the company to grow to more than 50 full-time employees and 200 customers worldwide. Along with overall management responsibility for worldwide operations, he is also responsible for defining SynTest's technology roadmap.
Prior to founding SynTest, Dr. Wang had worked at several technology companies, including Intel and Daisy Systems. Dr. Wang has published more than 40 technical papers and currently holds 16 US and European patents in the area of Test Generation, Built-in Self-Test (BIST), and Design for Testability. He is also a co-editor and co-author of two internationally used DFT texts: VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007). He received his MSEE and EE Ph.D. degrees from Stanford University, and his BSEE and MSEE from National Taiwan University, Taiwan.
About IEEE
A non-profit organization, IEEE is the world's leading professional association for the advancement of technology.
The IEEE name was originally an acronym for the Institute of Electrical and Electronics Engineers, Inc. Today, the organization's scope of interest has expanded into so many related fields, that it is simply referred to by the letters I-E-E-E (pronounced Eye-triple-E).
For nearly a century, the IEEE Awards program has paid tribute to technical professionals whose exceptional achievements and outstanding contributions have made a lasting impact on technology, society and the engineering profession.
The grade of Fellow recognizes unusual distinction in the profession and is conferred by the Board of Directors upon a person with an extraordinary record of accomplishments in any of the IEEE fields of interest. The accomplishments that are being honored are contributed importantly to the advancement or application of engineering, science and technology, bringing the realization of significant value to society.
The IEEE Fellows are an elite group from around the globe. The IEEE looks to the Fellows for guidance and leadership as the world of electrical and electronic technology continues to evolve.
About SynTest
SynTest Technologies, Inc., established in 1990, develops IP for advanced design-for-test (DFT) and design-for-debug/diagnosis (DFD) applications and markets them throughout the world, to semiconductor companies, system houses and design service providers. The company has filed more than 38 US/PCT patents of which 14 have been issued and 2 allowed. The Company's products improve an electronic design's quality and reduce overall design and test costs. Various applications that use these IP (intellectual properties) include logic BIST, memory BIST, boundary-scan synthesis, Scan/ATPG with test compression, concurrent fault simulation, silicon debug and diagnosis. The company headquartered in Sunnyvale, California, has offices in Taiwan, Japan, Korea and China, and distributors in Europe and Asia including Israel.
More information is available at www.syntest.com.
SynTest Technologies Inc. is headquartered at 505 South Pastoria Ave., Suite 101, Sunnyvale, California 94086, Phone: 408-720-9956, E-Mail: Email Contact
SynTest and TurboBIST-Logic are trademarks of SynTest Technologies, Inc. All other trademarks are property of their respective owners.
Press Contact:
Ravi Apte,
408-720-9956 x 300
Acronyms: ATPG: Automatic Test Pattern Generation ATE: Automatic Test Equipment BIST: Built-In Self-Test DFT: Design-for-Test DFD: Design-for-Debug/Diagnosis IP: Intellectual Property