Annual CMSC Conference Begins on July 20, 2015 in Hollywood, FL

May 12, 2015 -- The Coordinate Metrology Society (CMS) today announced the agenda of its popular, next-gen Measurement Zone providing both educational and competitive programs at the upcoming Coordinate Metrology Systems Conference (CMSC). Located in the CMSC Exhibition Hall, the venue delivers engaging experiences for attendees through daily activities in Five Zone areas, including hands-on competition challenges using portable metrology systems. The CMSC is a week-long technology conference for users of portable 3D measurement solutions applied by manufacturers and science laboratories. The conference will be held from July 20 – 24 at the Diplomat Resort and Spa in Hollywood, Florida.

The Measurement Zone will be coordinated by the National Physical Laboratory (UK), Metrologic, and assisted by the CMS Certification Committee. A workshop on laser trackers will be presented by Ben Hughes of the National Physical Library (NPL – UK). Hughes is a leading developer of intellectual property at NPL and holds six patents in the field of large volume metrology.  The CMSC Certification Committee, who is currently developing Level-Two Certification programs for device specific assessments, will be coordinating the workshop activities.  

This year's Advanced User's Competition will test the skills of expert metrologists during the CMSC. These industry veterans will have the option of utilizing multiple measurement devices to complete each task in the contest. Pre-registration is required.

Another Measurement Zone highlight is a measurement activity using a robot and a non-contact optical scanning system.  Participants will be required to review and understand automation product requirements prior to the exercise.  In another Zone area, delegates can try different portable metrology devices - a scanner, portable arm and laser tracker - using a series of scripted measurement processes. Users will not only learn different measurement methods, but also gain insight into how the CMS Certification and e-Learning Zones support their knowledge to complete the tasks.

e-Learning tablets will also be stationed in the Zone area to further support the knowledge and understanding of metrology. Attendees can study a variety of metrology topics from measurement uncertainty to dimensional control techniques. Also on tap is a new e-Learning program covering how to integrate strategic thinking into measurement plans, and apply industry best practices and behaviors.

The CMSC has built and sustained its industry reputation by delivering an impressive slate of original technical papers and presentations, year in and year out, for more than 30 years. This seminal gathering attracts leading OEMs and service providers, as well as expert speakers delivering fresh perspectives on trends, best practices, R&D, successful applications and innovations in the field of metrology.

About the Coordinate Metrology Society

The Coordinate Metrology Society is a membership of users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. The society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information about the CMS and how to join the organization, visit their web site at http://www.CMSC.org.

About the Coordinate Metrology Systems Conference

The Coordinate Metrology Systems Conference is an annual event sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe.  CMSC has achieved world renown for its comprehensive program of top-shelf white papers and applications presentations given by industry experts from science/research laboratories and leading manufacturing industries. No other trade show rivals the high level of authoritative information provided by CMS members and master users of metrology instrumentation, software, and peripheral equipment for quality control, quality production, and precision assembly and metrology-aided alignment.

CMS Press Contact:
Belinda Jones
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