All Categories : Technical Presentations Bookmark and Share

Title : SEICA shows how VIVA extend test coverage of complex boards with DiaTem JTAG tool
Company : TEMENTO Systems
Date : 06-Sep-2011
Rating :
Downloads : 3

Rate This File
5 Stars
4 Stars
3 Stars
2 Stars
1 Star

For a long time ATE companies deliver high quality ICT, Functional and Flying probe Testers. Today’s Electronic trends towards higher density and speed has pushed electronic board testers into an accessibility bottleneck which affects peculiarly the Bed of Nails (BoN). It led ATE companies to allow add-on JTAG testers, using Boundary Scan technique, to restore the declining test coverage. A seamless integration of both technologies is mandatory to make full use of Boundary Scan promise. While Marketers and analysts predict a symbiotic future, SEICA and TEMENTO SYSTEMS demonstrate an efficient integration TODAY.
User Reviews More Reviews Review This File
Featured Video
Jobs
GPU Design Verification Engineer for AMD at Santa Clara, California
CAD Engineer for Nvidia at Santa Clara, California
Sr. Silicon Design Engineer for AMD at Santa Clara, California
Senior Platform Software Engineer, AI Server - GPU for Nvidia at Santa Clara, California
Senior Firmware Architect - Server Manageability for Nvidia at Santa Clara, California
Design Verification Engineer for Blockwork IT at Milpitas, California
Upcoming Events
SEMICON Japan 2024 at Tokyo Big Sight Tokyo Japan - Dec 11 - 13, 2024
PDF Solutions AI Executive Conference at St. Regis Hotel San Francisco - Dec 12, 2024
DVCon U.S. 2025 at United States - Feb 24 - 27, 2025



© 2024 Internet Business Systems, Inc.
670 Aberdeen Way, Milpitas, CA 95035
+1 (408) 882-6554 — Contact Us, or visit our other sites:
AECCafe - Architectural Design and Engineering TechJobsCafe - Technical Jobs and Resumes GISCafe - Geographical Information Services  MCADCafe - Mechanical Design and Engineering ShareCG - Share Computer Graphic (CG) Animation, 3D Art and 3D Models
  Privacy PolicyAdvertise