Featured Paper by A. Čampa & M. Topič
In thin-film solar cells (a-Si:H, µc-Si:H, CIGS, etc.) scattering of light is very important to increase absorption of light in the active layers of solar cells. Today the most efficient thin-film solar cells are designed or deposited on random textured transparent conductive oxides (TCO). In order to study the scattering properties of the surface texture we have developed a numerical model in COMSOL, which calculates the scattering parameters from atomic force microscopy scan of surface texture/topography. This way we can study and evaluate the texture capabilities to scatter the light before producing such a texture, thus reducing time and cost for studying new types of textured surfaces. The simulation results obtained from the numerical model were compared to measured values.
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