9th International Symposium on Quality Electronic Design - ISQED March 17-19, 2008 San Jose
[ Back ]   [ More News ]   [ Home ]
9th International Symposium on Quality Electronic Design - ISQED March 17-19, 2008 San Jose



 

Registration

Please refer to ISQED web site at www.isqed.org for information regarding the tutorials, conference, tutorials, and hotel registration. Direct all conference inquiries to isqed@isqed.org. Early registration is recommended to take advantage of the discounted registration fee.

 

Exhibitions

ISQED08 Exhibition floor will be open on Tuesday afternoon, March 18, and features vendors offering design tools, methodologies, and services in the areas of design for manufacturing, yield, reliability, and quality. Exhibition includes embedded tutorials, panel discussions, and over 50 technical presentations. Exhibition floor attendance is free but needs advance on-line registration.

 

About ISQED

The International Symposium on Quality Electronic Design (ISQED) is a leading Electronic Design & Design Automation conference, aimed at bridging the gap among electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the pioneer and leading international conference dealing with design for manufacturability and quality issues front-to-back. ISQED emphasizes a holistic approach toward electronic design and intends to highlight and accelerate cooperation among the IC Design, EDA, Semiconductor Process Technology and Manufacturing communities. ISQED spans three days, Monday through Wednesday, in three parallel tracks, hosting over100 technical presentations, six keynote speakers, panel discussions, workshops/tutorials and other informal meetings.


Conference Highlights

Tutorials/Workshops

ISQED 2008 is pleased to offer a single full-day tutorial track, as well as three embedded tutorials, presented by several experts in their respective fields. List of topics covered is as follows:

 

The promise of high-κ/metal gates – From electronic transport phenomena to emerging device/circuit applications:

K. Maitra, AMD

Low Voltage Circuit Design Techniques for Sub-32nm Technologies:

Chris Kim, University of Minnesota

Process Technology Development and New Design Opportunities in 3D Integration Technology:

Robert E. Jones, Freescale

Robust System Design in Scaled CMOS:

Subhasis Mitra, Stanford University

Caches in the Many-Core Era:  What Purpose Might eDRAM Serve?:

Hillary Hunter, IBM

Enhancing Yield through Design for Manufacturability (DFM):

Praveen Elakkumanan, IBM / Puneet Gupta, UCLA

Managing early design feasibility issues through system physical prototyping:

Matthew Raggett - Javelin Design Automation

How to Determine Best DFM Practices:

Tom Jackson, Cadence

Mil/Aero/Vehicle High Reliability Design - Issues/challenges/solutions:

Chris Nicklaw, L3 Communications

Modifications and Tradeoffs in the Creation and Characterization of High Reliability IP:

Jens C. Michelsen, Nangate

 

Plenary Sessions

Two plenary sessions will be held on Tuesday and Wednesday mornings. Several industry & academia leaders will discuss the issues surrounding electronic design, design for yield and manufacturability and other critical topics from various points of view. Plenary keynote speakers are:

 

Drew Gude,  Microsoft Corporation

Robert Hum,  Mentor Graphics Corporation 

Sanjiv Taneja,  Cadence Design Systems

Chandu Visweswariah, IBM Thomas J. Watson Research Center

Rich Goldman, Synopsys Inc.

 

Panel Discussions

ISQED is pleased to offer three high-power panel discussion sessions, where many leading experts, address the important issue of quality design. These panels would focus on the following topics:

 

1. DFM: Is it Helping or Hurting?

2. Statistical Design - Solutions Searching for Problems?

3. ESL 2.0- Is Anybody Using It 2.0?

 

Luncheon Keynote

EDA Is Truly Where Electronics Quality Begins!

Antun Domic, Synopsys

 

 

Technical Sessions

ISQED Technical sessions start on Tuesday March 18, and continue until the afternoon of Wednesday, March 19. Beside the above plenary sessions, panel discussions, and workshops, the program consists of 22 technical sessions featuring well over100 papers on various challenging topics related to design for manufacturability and quality. A partial list of topics is shown below. Detail program is available on the web at www.isqed.org.

1. Manufacturing, Semiconductor Process and Devices
        
1.1 Design for Manufacturability/Yield & Quality (DFM/DFY/DFQ)
     
2. Design
        
2.1 System-level Design, Methodologies & Tools (SDM)
        2.2 Package - Design Interactions & Co-Design  (PDI)
        2.3 Robust &  Power-conscious Devices, Interconnects, and Circuits (PCC)

        2.4 Emerging/Innovative Process & Device Technologies and Design Issues (EDT)

        2.5 Design of Reliable Circuits and Systems (DFR)

3. EDA/CAD
        
3.1 EDA Methodologies, Tools, Flows & IP Cores; Interoperability  and Reuse (EDA)
        3.2 Design Verification and Design for Testability (DVFT)
        3.3 Physical Design, Methodologies & Tools (PDM)