Development of solutions to reduce time-to-yield through test
LogicVision will be developing a standard design and test environment based on the Standard Test Interface Language (STIL), as part of STARC's STIL-based Semiconductor Test Action Group (SSTAG). STARC believes that STIL application guidelines will help test cost reduction of semiconductor manufacturing, and contribute to the success of the semiconductor industry.
In semiconductor testing, specific test programs are required. The specifications of test program language are developed by tester vendors, using STIL, which is partially standardized as IEEE 1450. Despite this attempt at standardization, deviations in the interpretation of STIL language used for validation test of semiconductors results in inefficiency and increases both time to market and test costs.
SSTAG recently completed guidelines for IEEE 1450.0 (test pattern description) and 1450.2 (DC test description) and is expected to soon issue the "STIL Application Guidebook, Rev.1.0" on the STARC website. SSTAG will continue developing test standards, with the next phase anticipated to begin in April 2006.
"LogicVision brings a unique test perspective to the table," said Nobuo Fudanuki, Vice President at STARC. "SSTAG aims to provide the industry with more practical and more effective test interface over the IEEE standard. We believe LogicVision's participation with SSTAG will result in wider coverage of the tool sets using this common interface, not only in the test and failure analysis field, but also in manufacturing yield enhancement."
"As the leader in field proven at-speed testing, LogicVision is able to contribute significant guidance," said Jim Healy, president and CEO for LogicVision. "We are pleased to be working closely with STARC, and look forward to offering the benefits of this development partnership to STARC and our customers."
About LogicVision, Inc.
LogicVision, Inc. provides unique yield learning capabilities in the design for manufacturing space. These capabilities enable its customers, leading semiconductor companies, to more quickly and efficiently learn to improve product yields. The company's advanced Design for Test (DFT) product line, ETCreate, works together with ETAccess and SiVision yield learning applications to improve profit margins by reducing device field returns, reducing test costs, and accelerating both time to market and time to yield. LogicVision solutions are used in the development of semiconductor ICs for products ranging from digital consumer goods to wireless communications devices and satellite systems. LogicVision was founded in 1992 and is headquartered in San Jose, Calif. For more information visit www.logicvision.com.
About Semiconductor Technology Academic Research Center (STARC)
The Semiconductor Technology Academic Research Center, STARC, is a research consortium co-founded by eleven major Japanese semiconductor companies* in December 1995. STARC's mission is to contribute the growth of the Japanese semiconductor industry by developing leading-edge SoC (System on a Chip) design technologies.
Currently, STARC is pursuing six objectives toward achieving its mission:
1) Development of technologies for improving design productivity;
2) Development of technologies aimed at re-use and sharing of design
assets (IP);
3) Development of design technologies to increase the added value of SoC;
4) Promotion of collaborative research with universities; and
5) Training and educational support for engineers and researchers in the
semiconductor field.
For more information, please visit the STARC web site at http://www.starc.jp/index-e.html.
Note: * (In Alphabetical Order)
Fujitsu Limited, Matsushita Electric Industrial Co., Ltd.,
NEC Electronics Corporation, Oki Electric Industry Co., Ltd,
Renesas Technology Corporation, Rohm Co., Ltd,
Sanyo Electric Co., Ltd, Seiko Epson Corporation,
Sharp Corporation, Sony Corporation, Toshiba Corporation.
Forward Looking Statements
Except for the historical information contained herein, the matters set forth in this press release, including statements as to the expected benefits and results of participation in STARC, are forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995. These forward-looking statements are subject to risks and uncertainties that could cause actual results to differ materially, including, but not limited to, the risk that participation in STARC will not lead to the benefits that were expected by LogicVision, the activities of SSTAG in developing standards and guidelines as currently anticipated,, and other risks detailed in Form 10-Q for the quarter ended September 30, 2005, and from time to time in LogicVision's SEC reports. These forward-looking statements speak only as of the date hereof. LogicVision disclaims any obligation to update these forward- looking statements.
CONTACT: Kirsten McMullen of LogicVision, Inc., +1-408-453-0146,
Email Contact
Web site: http://www.logicvision.com/