SANTA CLARA, Calif.—(BUSINESS WIRE)—May 29, 2008— Solido Design Automation, innovator of process variation solutions for transistor-level integrated circuit (IC) designers, will be demonstrating solutions to head off statistical and proximity variations in analog/mixed-signal, custom digital and memory ICs in Booth #660 at the Design Automation Conference (DAC), Anaheim Convention Center in Anaheim, California from June 8^th to 13^th, 2008. To register for a one-on-one suite demonstration, please visit http://www.solidodesign.com/dac08_demo.shtml.

Other Solido Design Automation activities at DAC include:

--		Technical seminar on "Variation Robustness for Analog/Mixed-Signal, Custom Digital and Memory Design" presented by Patrick Drennan, Solido's Chief Technology Officer. This seminar will include a brief review of the physical phenomena and industry standard device models for variation sources, including random local and global variations and systematic proximity effects. New techniques to accelerate, increase accuracy and derive more information from statistical variation analysis will be presented. Free; breakfast included.
		WHEN: Wednesday, June 11, 2008 from 9:00am - 10:00am
		WHERE: Anaheim Hilton and Towers, Room: El Capitan AB
		WHO: Of interest to designers, design managers, CAD managers
		HOW: Please register at http://www.solidodesign.com/dac08_tech_seminar.shtml
--		Tutorial on "Robust Analog/Mixed-signal Design" featuring Trent McConaghy, Solido's Chief Scientific Officer, as one of four speakers. Tutorial organized by Joel Phillips of Cadence Design Systems. For more detail, see http://www.dac.com/events/eventdetails.aspx?id=77-132
		WHEN: Friday, June 13, 2008 from 9:00am - 5:00pm
		WHERE: Anaheim Conference Center, Room 208AB
		WHO: Of interest to engineers working on analog/mixed-signal/RF designs and simulation

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